具(ju)體(ti)測試系統采用(yong)如下(xia)架構，針對BMS的(de)(de)各項(xiang)(xiang)功能(neng)，采用(yong)針對性的(de)(de)儀器(qi)進行數據(ju)模(mo)擬，用(yong)來測試BMS是(shi)否(fou)能(neng)按計劃(hua)設計的(de)(de)要(yao)求進行工(gong)作。對電池(chi)組異常狀態(tai)的(de)(de)管理——單體(ti)和(he)(he)電池(chi)組的(de)(de)過(guo)(guo)充(chong)、過(guo)(guo)放、過(guo)(guo)流、溫度超限、失(shi)衡等(deng)(deng)，對電池(chi)組故障的(de)(de)管理——傳感器(qi)丟失(shi)、單體(ti)故障等(deng)(deng)。BMS的(de)(de)各項(xiang)(xiang)功能(neng)所涉(she)及到包括(kuo)數據(ju)采集、過(guo)(guo)程控制、數據(ju)通訊等(deng)(deng)多(duo)種(zhong)(zhong)技術，bms測試項(xiang)(xiang)目，應用(yong)ADC、DIO、PWM、CAN、繼電器(qi)等(deng)(deng)多(duo)種(zhong)(zhong)端(duan)口和(he)(he)設備，功能(neng)和(he)(he)算法都(dou)很復雜(za)。

BMS電(dian)(dian)池(chi)(chi)管(guan)理測(ce)試(shi)(shi)(shi)系(xi)統有什(shen)么重(zhong)要功能嗎(ma)BMS電(dian)(dian)池(chi)(chi)管(guan)理測(ce)試(shi)(shi)(shi)系(xi)統的功能有：滿足BMS電(dian)(dian)氣參數測(ce)量精(jing)度試(shi)(shi)(shi)驗(yan)、SOC估(gu)算精(jing)度試(shi)(shi)(shi)驗(yan)、電(dian)(dian)氣絕緣(yuan)耐(nai)(nai)(nai)壓性(xing)(xing)能試(shi)(shi)(shi)驗(yan)、電(dian)(dian)池(chi)(chi)故(gu)障診(zhen)斷試(shi)(shi)(shi)驗(yan)、過電(dian)(dian)壓運(yun)行試(shi)(shi)(shi)驗(yan)、欠電(dian)(dian)壓運(yun)行試(shi)(shi)(shi)驗(yan)、高(gao)溫(wen)運(yun)行試(shi)(shi)(shi)驗(yan)、低溫(wen)運(yun)行試(shi)(shi)(shi)驗(yan)、耐(nai)(nai)(nai)高(gao)溫(wen)性(xing)(xing)能試(shi)(shi)(shi)驗(yan)、耐(nai)(nai)(nai)低溫(wen)性(xing)(xing)能試(shi)(shi)(shi)驗(yan)、耐(nai)(nai)(nai)高(gao)溫(wen)變化性(xing)(xing)能試(shi)(shi)(shi)驗(yan)、耐(nai)(nai)(nai)濕(shi)熱性(xing)(xing)能試(shi)(shi)(shi)驗(yan)、耐(nai)(nai)(nai)電(dian)(dian)源(yuan)極(ji)性(xing)(xing)反接(jie)試(shi)(shi)(shi)驗(yan)、絕緣(yuan)電(dian)(dian)阻測(ce)量等十多項測(ce)試(shi)(shi)(shi)。

能(neng)源消耗大(da)——電(dian)(dian)池組(zu)(zu)的(de)(de)(de)充(chong)電(dian)(dian)和放電(dian)(dian)需(xu)(xu)要大(da)量能(neng)源，系統成本高(gao)——電(dian)(dian)池組(zu)(zu)自身價格(ge)比較高(gao)，尤(you)其是大(da)功率(lv)的(de)(de)(de)電(dian)(dian)池組(zu)(zu)；相關的(de)(de)(de)維(wei)護費用(yong)也很高(gao)。需(xu)(xu)要的(de)(de)(de)輔(fu)助(zhu)設備多——為了模擬(ni)各種環境狀態，需(xu)(xu)要大(da)型恒(heng)溫箱等輔(fu)助(zhu)設施，調整(zheng)(zheng)參數困(kun)難——如果用(yong)于(yu)BMS單項功能(neng)的(de)(de)(de)驗(yan)證和調試(shi)(shi)，在(zai)開始試(shi)(shi)驗(yan)之前要通(tong)過(guo)充(chong)電(dian)(dian)放電(dian)(dian)來調整(zheng)(zheng)電(dian)(dian)池組(zu)(zu)的(de)(de)(de)狀態。基(ji)于(yu)電(dian)(dian)池組(zu)(zu)的(de)(de)(de)測(ce)試(shi)(shi)和驗(yan)證。通(tong)過(guo)高(gao)精(jing)(jing)度(du)的(de)(de)(de)程(cheng)控(kong)電(dian)(dian)池模擬(ni)器來電(dian)(dian)池單體的(de)(de)(de)電(dian)(dian)壓，并(bing)具有一定的(de)(de)(de)電(dian)(dian)流輸出和吸收能(neng)力，放電(dian)(dian)和充(chong)電(dian)(dian)過(guo)程(cheng)，通(tong)過(guo)高(gao)精(jing)(jing)度(du)的(de)(de)(de)程(cheng)控(kong)電(dian)(dian)阻來各溫度(du)傳感器。