電離室能量響應

能(neng)量(liang)(liang)(liang)(liang)響(xiang)應(ying)(ying)如上所述，電(dian)離(li)(li)室(shi)(shi)(shi)的(de)(de)響(xiang)應(ying)(ying)(靈敏度(du))正比于(yu)空(kong)氣(qi)比釋動能(neng)率(照射量(liang)(liang)(liang)(liang)率)，而不(bu)受(shou)其他影響(xiang)，例如不(bu)應(ying)(ying)隨(sui)能(neng)量(liang)(liang)(liang)(liang)的(de)(de)變(bian)化(hua)(hua)而變(bian)化(hua)(hua)，高氣(qi)壓球(qiu)形電(dian)離(li)(li)室(shi)(shi)(shi)，不(bu)應(ying)(ying)隨(sui)溫度(du)的(de)(de)變(bian)化(hua)(hua)而變(bian)化(hua)(hua)等。但是由于(yu)電(dian)離(li)(li)室(shi)(shi)(shi)本身不(bu)能(neng)完(wan)全由空(kong)氣(qi)制作，高氣(qi)壓球(qiu)形電(dian)離(li)(li)室(shi)(shi)(shi)公司，不(bu)能(neng)完(wan)全等同于(yu)空(kong)氣(qi)，當輻射的(de)(de)能(neng)量(liang)(liang)(liang)(liang)改(gai)(gai)變(bian)后(hou)，電(dian)離(li)(li)室(shi)(shi)(shi)的(de)(de)響(xiang)應(ying)(ying)(靈敏度(du))也隨(sui)之改(gai)(gai)變(bian)，這種特性稱(cheng)之為(wei)能(neng)量(liang)(liang)(liang)(liang)響(xiang)應(ying)(ying)。對(dui)于(yu)劑量(liang)(liang)(liang)(liang)測量(liang)(liang)(liang)(liang)的(de)(de)電(dian)離(li)(li)室(shi)(shi)(shi)，能(neng)量(liang)(liang)(liang)(liang)響(xiang)應(ying)(ying)是極為(wei)重(zhong)(zhong)要(yao)的(de)(de)性能(neng)參數，而對(dui)于(yu)劑量(liang)(liang)(liang)(liang)監測的(de)(de)電(dian)離(li)(li)室(shi)(shi)(shi)雖然也關心能(neng)量(liang)(liang)(liang)(liang)響(xiang)應(ying)(ying)，高氣(qi)壓球(qiu)形電(dian)離(li)(li)室(shi)(shi)(shi)哪家好，但不(bu)是非常重(zhong)(zhong)要(yao)。

電離室按(an)照(zhao)測(ce)量對象分類

1）α電(dian)(dian)離(li)室(shi)(shi)(shi)(shi)、β電(dian)(dian)離(li)室(shi)(shi)(shi)(shi)、或α、β電(dian)(dian)離(li)室(shi)(shi)(shi)(shi)，電(dian)(dian)離(li)室(shi)(shi)(shi)(shi)的部(bu)分壁非常薄，是的α、β粒子或其次(ci)級電(dian)(dian)子可以穿過，到達靈敏(min)體積(ji)。有(you)時(shi)也設計(ji)成(cheng)將α、β源直接置入電(dian)(dian)離(li)室(shi)(shi)(shi)(shi)內部(bu)的形(xing)式(shi)；

2）γ電(dian)離室電(dian)離室壁通常有(you)一(yi)定厚(hou)度(du)，從而降低對α、β粒(li)子(zi)的響應(ying)；

3）中(zhong)子(zi)(zi)電(dian)(dian)離(li)室(shi)(shi)用于(yu)中(zhong)子(zi)(zi)劑量(liang)測量(liang)，常設計成雙電(dian)(dian)離(li)室(shi)(shi)的(de)形式。其基(ji)本原理是石(shi)墨電(dian)(dian)離(li)室(shi)(shi)主要對(dui)光子(zi)(zi)響(xiang)應，對(dui)中(zhong)子(zi)(zi)基(ji)本無響(xiang)應，而塑料電(dian)(dian)離(li)室(shi)(shi)則對(dui)光子(zi)(zi)和中(zhong)子(zi)(zi)都響(xiang)應，計算二個(ge)電(dian)(dian)離(li)室(shi)(shi)響(xiang)應之(zhi)差便(bian)是中(zhong)子(zi)(zi)劑量(liang)；

4）電子束電離(li)室，專門用于加速電子束測量的平行平板(ban)電離(li)室；

5）布喇(la)格峰(feng)電(dian)離(li)室(shi)，設(she)計用(yong)于測量重離(li)子射(she)束的(de)布喇(la)格峰(feng)的(de)電(dian)離(li)室(shi)。

電離室

電(dian)(dian)(dian)離(li)(li)(li)室(shi)是利用(yong)(yong)電(dian)(dian)(dian)離(li)(li)(li)輻(fu)射的(de)(de)(de)電(dian)(dian)(dian)離(li)(li)(li)效應測(ce)量電(dian)(dian)(dian)離(li)(li)(li)輻(fu)射的(de)(de)(de)探測(ce)器(qi)，又稱離(li)(li)(li)子(zi)室(shi)，臺灣等地(di)稱電(dian)(dian)(dian)離(li)(li)(li)箱。電(dian)(dian)(dian)離(li)(li)(li)室(shi)由(you)處于不同電(dian)(dian)(dian)位(wei)的(de)(de)(de)電(dian)(dian)(dian)極和(he)其間的(de)(de)(de)介質組(zu)成(cheng)。電(dian)(dian)(dian)離(li)(li)(li)室(shi)是比較(jiao)早的(de)(de)(de)輻(fu)射探測(ce)器(qi)。也是一(yi)種探測(ce)電(dian)(dian)(dian)離(li)(li)(li)輻(fu)射的(de)(de)(de)氣體(ti)探測(ce)器(qi)。氣體(ti)探測(ce)器(qi)的(de)(de)(de)原(yuan)理是，當(dang)探測(ce)器(qi)受到射線(xian)照射時，高氣壓球形電(dian)(dian)(dian)離(li)(li)(li)室(shi)多(duo)少(shao)錢，射線(xian)與氣體(ti)中(zhong)的(de)(de)(de)分子(zi)作用(yong)(yong)，產生由(you)一(yi)個(ge)電(dian)(dian)(dian)子(zi)和(he)一(yi)個(ge)正離(li)(li)(li)子(zi)組(zu)成(cheng)的(de)(de)(de)離(li)(li)(li)子(zi)對。這些(xie)離(li)(li)(li)子(zi)向周(zhou)圍區(qu)域自由(you)擴散。擴散過程中(zhong)，電(dian)(dian)(dian)子(zi)和(he)正離(li)(li)(li)子(zi)可以復(fu)合重新(xin)形成(cheng)中(zhong)性分子(zi)。