該(gai)系(xi)統主要由(you)高精度電(dian)(dian)(dian)池(chi)模擬(ni)器(qi)、溫度模擬(ni)器(qi)、總電(dian)(dian)(dian)壓(ya)(ya)模擬(ni)單(dan)元(yuan)(yuan)(yuan)、充放(fang)電(dian)(dian)(dian)電(dian)(dian)(dian)流模擬(ni)單(dan)元(yuan)(yuan)(yuan)、溫度模擬(ni)單(dan)元(yuan)(yuan)(yuan)、絕緣電(dian)(dian)(dian)阻檢(jian)(jian)測單(dan)元(yuan)(yuan)(yuan)、信(xin)號與開(kai)關量檢(jian)(jian)測單(dan)元(yuan)(yuan)(yuan)、CAN通(tong)訊單(dan)元(yuan)(yuan)(yuan)、軟(ruan)件控(kong)制(zhi)系(xi)統等(deng)組成(cheng)。所以這個方法只(zhi)適用(yong)于驗(yan)證BMS在正常(chang)工作范圍內的(de)表現，而(er)不(bu)適合(he)應用(yong)于BMS的(de)開(kai)發(fa)調試和生產測試電(dian)(dian)(dian)池(chi)管(guan)理系(xi)統（Battery Management System簡稱BMS），不(bu)僅對(dui)電(dian)(dian)(dian)池(chi)電(dian)(dian)(dian)壓(ya)(ya)、電(dian)(dian)(dian)流、溫度等(deng)參數實時監視，同時兼顧電(dian)(dian)(dian)池(chi)充放(fang)過(guo)程中漏電(dian)(dian)(dian)檢(jian)(jian)測、熱管(guan)理、電(dian)(dian)(dian)池(chi)均衡管(guan)理、報警提醒、SOC計(ji)算、SOH狀(zhuang)態報告等(deng)功能(neng)。

均(jun)(jun)衡(heng)(heng)管(guan)理：根據(ju)均(jun)(jun)衡(heng)(heng)策(ce)略，銅(tong)陵bms測(ce)試，將一致性較差(cha)的(de)電(dian)(dian)(dian)(dian)池電(dian)(dian)(dian)(dian)量通(tong)(tong)過(guo)電(dian)(dian)(dian)(dian)量轉(zhuan)移(yi)(主(zhu)動(dong)均(jun)(jun)衡(heng)(heng))或直(zhi)接通(tong)(tong)過(guo)電(dian)(dian)(dian)(dian)阻釋放電(dian)(dian)(dian)(dian)能的(de)方式(shi)將電(dian)(dian)(dian)(dian)池拉(la)到(dao)同一水平線(xian)(被(bei)動(dong)均(jun)(jun)衡(heng)(heng))。通(tong)(tong)過(guo)高(gao)精度的(de)程(cheng)(cheng)控(kong)DAC來電(dian)(dian)(dian)(dian)流傳感(gan)器，通(tong)(tong)過(guo)數(shu)字(zi)IO、DAC、CAN總線(xian)通(tong)(tong)訊(xun)模塊、程(cheng)(cheng)控(kong)電(dian)(dian)(dian)(dian)源等輔助設備實現其它功能端口的(de)以及與BMS的(de)通(tong)(tong)訊(xun)。實際狀態未知(zhi)(zhi)——這一點是致命的(de)。電(dian)(dian)(dian)(dian)池組中每(mei)個電(dian)(dian)(dian)(dian)池單體的(de)電(dian)(dian)(dian)(dian)壓、溫度、均(jun)(jun)衡(heng)(heng)電(dian)(dian)(dian)(dian)流等參數(shu)的(de)設定值是未知(zhi)(zhi)的(de)，bms自動(dong)測(ce)試系(xi)統，用(yong)戶只能獲取(qu)到(dao)測(ce)量值，無法比對。

能(neng)源(yuan)消耗大——電(dian)(dian)(dian)池(chi)組的(de)(de)(de)(de)充電(dian)(dian)(dian)和放(fang)電(dian)(dian)(dian)需(xu)要大量能(neng)源(yuan)，系統成(cheng)本高——電(dian)(dian)(dian)池(chi)組自身價格(ge)比(bi)較(jiao)高，尤其是(shi)(shi)大功率的(de)(de)(de)(de)電(dian)(dian)(dian)池(chi)組；相關的(de)(de)(de)(de)維護費用也(ye)很(hen)高。為了對這么復雜的(de)(de)(de)(de)功能(neng)進行(xing)測(ce)試(shi)(shi)(shi)——很(hen)多情況下還要進行(xing)性(xing)能(neng)測(ce)試(shi)(shi)(shi)和評(ping)估—將被管(guan)理的(de)(de)(de)(de)電(dian)(dian)(dian)池(chi)組實(shi)(shi)物(wu)與BMS對接進行(xing)測(ce)試(shi)(shi)(shi)，這種(zhong)測(ce)試(shi)(shi)(shi)方法直(zhi)接，所(suo)有(you)的(de)(de)(de)(de)測(ce)試(shi)(shi)(shi)參數(shu)都(dou)與實(shi)(shi)際(ji)情況一致。看似(si)比(bi)較(jiao)理想，但是(shi)(shi)實(shi)(shi)際(ji)應用的(de)(de)(de)(de)時(shi)候存在比(bi)較(jiao)多的(de)(de)(de)(de)問題：測(ce)試(shi)(shi)(shi)時(shi)間長——電(dian)(dian)(dian)池(chi)組的(de)(de)(de)(de)充放(fang)都(dou)需(xu)要比(bi)較(jiao)多的(de)(de)(de)(de)時(shi)間，bms測(ce)試(shi)(shi)(shi)哪家好，要完成(cheng)一次工作循(xun)環必須遵(zun)從實(shi)(shi)物(wu)的(de)(de)(de)(de)特性(xing)，等待的(de)(de)(de)(de)時(shi)間比(bi)較(jiao)長，難(nan)以進行(xing)批(pi)量測(ce)試(shi)(shi)(shi)。